Test Results
Just A Click Away

Test Engineering, Reimagined

Capture, Aggregate, Normalize and Analyze Test Data in Real-Time From Any Format

Building the Digital Thread for Electronics Manufacturers.

Out of the box tools and processes to 

  • What to consider when implementing a new test format
    • Extensibility
    • Compatibility
    • Future Proof
  • Raw Data support
    • Customized Formats
    • Binary, text, images, PDF, other
  • Application of ATML Test Results and IntraStage to facilitate Intelligent Data Analysis
  • How Raw Data Facilitates Intelligent Data Analysis
  • Customization and Integration use case
  • Integration of manufacturing parametrics with existing PLM, ERP, and MES
  • Integration of existing home-grown parametric data warehouse with new FA frontend and advanced analytics and
  • ETL process for new datasets
  • Features of a complex electronics data warehouse
  • The Advantages of a DataWarehouse vs a Data Lake 
  • Gage RnR
  • SPC
  • Hidden Factory
  • Other DB integration
  • Enterprise integration
  • Emerging standard and best practices
  • Workflows
  • Steps to master
  • Spec phase/requirements
  • Subscriptions

Yield and Pareto drilldowns

Learn how General Atomics digitized multiple data silos to ID issues that affected product quality

Real-time visibility

Converting ATE data and digitizing paper forms to identify and resolve manufacturing problems quickly
Read the Case Study

Turning Data Into Action

Learn how Medtronic integrated BlackBelt to gain a full picture of their KPIs

SPC insight

Full system monitoring product quality and process efficiency
Read the Case Study

Lower Costs, Faster Production time

Analyzing data from across the product lifecycle

WiP and Cycle Times

Intelligence from supplier subcomonents, CM Lower-Level Assemblies, and Higher-Level Assemblies
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