Test Results Just a Click Away

Test your product with full traceability of process and test performance.

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    Automatically capture, monitor and analyze test data in real-time from any format

    Better, Faster Engineering Decisions with Monitoring SPC and Detailed Measurement Analysis. CLICK TO ZOOM
    Drill down from high level yield. CLICK TO ZOOM
    Rapid Test Engineering Workflows

    • Web-access to all tester records and analytics

    • UUT History/Event Report

    • Raw data support, including waveforms

    • Complete Serial Number History Report

    • Characterize and Correlate

    • Statistical Process Control (SPC)

    • Failure Paretos

    • Station Performance and optimization

    • Test Process Performance

    • First-Pass, Last-Pass, Throughput Yield

    • Retest/Rework

    • Drilldown from Yield or SPC to unit performance

    • Web-based graphs and charts

    • Traceability

    Building the Digital Thread for Electronics Manufacturer requires the ability to seamlessly incorporate new and upcoming sources of manufacturing data, enterprise attributes, and other silo’d data sources.

    What to consider when implementing a new test format
    • Extensibility
    • Compatibility
    • Future Proof

    Raw Data support
    • Customized Formats
    • Binary, text, images, PDF, other

    • (PDF Download): Application of ATML Test Results and IntraStage to facilitate Intelligent Data Analysis

    • (PDF download) How To Use Test Data to Better Manage ATEs


    Manufacturing Intelligence means having the off-the-shelf analytics and documentation to deploy and support advanced test engineering features.

    • Gage RnR on-demand

    • Realtime SPC and WECO

    • Hidden Factory

    • Other DB integration

    • Enterprise integration

    • Emerging standard and best practices

    • Workflows

    • Spec phase/requirements

    • Subscriptions

    • The Power of Attributes and Metadata

    • Applying Machine Learning and A.I.

    • Strategy for Very Large Datasets

    Yield and Pareto drilldowns

    Learn how General Atomics digitized multiple data silos to ID issues that affected product quality

    Real-time visibility

    Converting ATE data and digitizing paper forms to identify and resolve manufacturing problems quickly

    Turning Data Into Action

    Learn how Medtronic integrated BlackBelt to gain a full picture of their KPIs

    SPC insight

    Full system monitoring product quality and process efficiency

    Lower Costs,
    Faster Production time

    Analyzing data from across the product lifecycle

    WiP and Cycle Times

    Intelligence from supplier subcomonents, CM Lower-Level Assemblies, and Higher-Level Assemblies

    See how BlackBelt can deliver full traceability of test and performance. Start your FREE Trial.