world leader in semiconductor and integrated circuit test
A world leader in semiconductor test and the production and support of Integrated Circuit Testers needed to have real-time visibility into full product lifecycle: from supplier components to contract-manufactured assemblies to the performance of their final assemblies to MRO.
” IntraStage is about realizing our vision of the factory of the future”
Director of Engineering
Challenge
- Multiple product lines with data from across the product lifecycle, including supplier subcomponents, contract-manufactured lower-level assemblies (LLAs), and higher-level assemblies (HLAs)
- Need for correlation and tracking of performance, rework and reassembly of LLAs into and with HLAs with full product genealogy
- Need to integrate Manufacturing data with enterprise systems (Flexflow-MES, Team Center – PLM, Agile PLM, Spider- QMS, BOM and Oracle – ERP/AVL )
Solution
- Global enterprise analytics integrating Quality, Process and Enterprise systems data visibility in a continuous single source of truth.
- Phased implementation of BlackBelt Analytics to suppliers, contract manufacturers, and in-house final production lines
- Real-time insight into reports with high business value and cost
- Integrated solution for component to Instrument genealogy
Benefits
- Multiple product lines with data from across the product lifecycle, including supplier subcomponents, contract-manufactured lower-level assemblies (LLAs), and higher-level assemblies (HLAs)
- Need for correlation and tracking of performance, rework and reassembly of LLAs into and with HLAs with full product genealogy
- Need to integrate Manufacturing data with enterprise systems (Flexflow-MES, Team Center – PLM, Agile PLM, Spider- QMS, BOM and Oracle – ERP/AVL )
Related Use Cases
Turning Data Into Action
Learn how Medtronic integrated BlackBelt to gain a full picture of their KPIs
Anticipating IC Performance
Achieving Productivity gains, Quality improvement, and Operational results
Limit Tuning
Transforming manual processes on very complex, extremely large, and sensitive data
Read the Case Study
Quickly Root-Causing Issues
Immediate insight into performance and quality issues down to component-level performance
Instant Defect Analysis
Improving throughput yield and reducing costs of goods sold
Read the case study
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