Leonardo (formerly Selex Electronics Systems/Selex Galileo)

advanced engineering company, committed to delivering winning, cost-effective solutions in the aerospace and defense sectors,

“Within two months of implementation of IntraStage, we improved our DPU rate. We generate a lot of test data and the manual effort to collect it, aggregate it, and analyze it through ad-hoc software solutions was very time consuming.”

Senior Engineer, Captor-E Radar System


  • Need to identify and minimize manufacturing/repair touch time
  • Need to investigate yield and performance issues at multiple sites with Secure and Secret deployments
  • Disparate Data from Complex Test Systems
  • Normalize and analyze data from ATML, NI TestStand, LabVIEW TDMS, PDF and various Text, CSV and Excel formats.


  • Aggregation of manufacturing and field/return data from Integration, ESS Thermal, ESS Vibration, Pre-ATP, ATP
  • Identify trends such as: measurement variation between test stations, test software impact on performance, and operator impact on performance and yield
  • Continuously gathering of test data fin any format, NI TestStand, LabVIEW TDMS, PDF, and multiple variants of .txt, CSV, and Excel formats with hundreds of metadata points for performance characterization.


  • Minimizing manufacturing/repair touch time
  • Faster production throughput
  • Reduction in Defect Per Unit (DPU) for high value assemblies.
  • Measure and track Throughput Yield
  • Single source of truth for as-built performance
  • Multi-site cross functional collaboration
  • Reduction in high value resource demand

Related Use Cases

Quickly Root-Causing Issues

Immediate insight into performance and quality issues down to component-level performance

Instant Defect Analysis

Improving throughput yield and reducing costs of goods sold
Read the case study

Turning Data Into Action

Learn how Medtronic integrated BlackBelt to gain a full picture of their KPIs

SPC insight

Full system monitoring product quality and process efficiency
Read the Case Study

Yield and Pareto drilldowns

Learn how General Atomics digitized multiple data silos to ID issues that affected product quality

Real-time visibility

Converting ATE data and digitizing paper forms to identify and resolve manufacturing problems quickly
Read the Case Study

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Demo The Software

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