Reduce disruptions with early quality engagement.
Applications include:
- Supplier Parts Inspection/Lot Testing
- First Article Inspection
- Incoming/Just In Time Inspection
- Visual Inspection/Final QA
- Bench Testing
- Manual Stations
- Digital Traveler
In most complex manufacturing environments, some critical Test Data is still recorded in paper based logs or in spreadsheets. Data from these processes stays can remain in silos, which creates obstacles for engineers to access, analyze, and use to improve testing processes and product design.
IntraStage’s Paperless Manufacturing allows you to create, publish, and support your own manual-data entry web forms.
Features include:
- Multi-serial number entry
- Realtime Feedback window with Procedures / instructions / schematics / drawings / WECO / SPC
- Context sensitive limits and instructions at every step
- Numeric, string, drop-down, and Boolean measurement support
Implement Paperless Forms on your hosted or on-prem IntraStage BlackBelt deployment. Deploy and validate your Forms in days. Contact us to demo Paperless Forms today.
LEONARDO needed to identify and minimize manufacturing/repair touch time as well as the ability to investigate yield and performance issues at multiple sites with Secure and Secret deployments.
They required the ability to analyze disparate data from complex test systems and normalize analysis data from ATML, NI TestStand, LabVIEW TDMS, PDF and text, CSV and Excel formats.
Highly complex products with tight safety and reliability metrics. Need to analyze production data to quickly identify issues affecting yield and performance. Data aggregation from AOI,AXI,ICT,FCT, ESS, Failures, Rework and ATP performance test.
Apply Statistical Process Control ( SPC) across a wide number of process variables such as CpK.
“IntraStage core technologies has enabled the visibility needed to achieve a 90% reduction of our yield issues. This helped ultimately reduce our Cost of Goods Sold by £ 500,000 / year via achieving target improvements in Rolled Throughput Yield.”
