A world leader in semiconductor test and the production and support of Integrated Circuit Testers needed to have real-time visibility into full product lifecycle: from supplier components to contract-manufactured assemblies to the performance of their final assemblies to MRO.
Multiple product lines with data from across the product lifecycle, including supplier subcomponents, contract-manufactured lower-level assemblies (LLAs), and higher-level assemblies (HLAs).
Need for correlation and tracking of performance, rework and reassembly of LLAs into and with HLAs with full product genealogy.
Need to integrate Manufacturing data with enterprise systems (Flexflow-MES, Team Center – PLM, Agile PLM, Spider- QMS, BOM and Oracle – ERP/AVL ).
Global enterprise analytics integrating Quality, Process and Enterprise systems data visibility in a continuous single source of truth.
Phased implementation of BlackBelt Analytics to suppliers, contract manufacturers, and in-house final production lines
Real-time insight into reports with high business value and cost.
Integrated solution for component to Instrument genealogy.
Multiple product lines with data from across the product lifecycle, including supplier subcomponents, contract-manufactured lower-level assemblies (LLAs), and higher-level assemblies (HLAs).
Need for correlation and tracking of performance, rework and reassembly of LLAs into and with HLAs with full product genealogy.
Need to integrate Manufacturing data with enterprise systems (Flexflow-MES, Team Center – PLM, Agile PLM, Spider- QMS, BOM and Oracle – ERP/AVL ).
Yield issues with a lack of visibility into the factors contributing to yield variations.
Need to aggregate data from multiple ATE systems and paper-based processes for compliance and performance insight.
Test station verification/validation and efficiency issues.
Retest issues without visibility into the cause of retest.
Need for ITAR-compliant data security.
Maintain tight performance tolerances of RF semiconductor design. Very large datasets meant that, in some cases, it took over two days just to aggregate data and forming it to be ready for analysis.
Manufacturing and NPI data needed to be aggregated to allow limit tuning and measurement variance.
“The number one thing you are supposed to do is…look at the measurement data as it comes in. Don’t wait until it literally bangs into the limit and stops the production line. You are supposed to look for trends before you get there.”
