Design and manufacturing of critical systems and components for aerospace, defense, and space.
Yield issues with a lack of visibility into the factors contributing to yield variations.
Need to aggregate data from multiple ATE systems and paper-based processes for compliance and performance insight.
Test station verification/validation and efficiency issues.
Retest issues without visibility into the cause of retest.
Need for ITAR-compliant data security.
Implementation of stock and custom adapters to capture and normalize disparate ATE data.
Support high-volume (30k plus forms in 6 months) manual data capture via Paperless Manufacturing.
Developed a Retest report (now in BlackBelt for all customers) to show retest metrics.
Use of the Limit Simulation report to gauge how adherence to internally developed control limits were affecting overall yield.
Retest Reports accurately reported the performance of different fixtures, proving the case to implement new fixtures to increase yield and efficiency.
One-click proof to their customer to receive clearance to use customer-set spec limits instead of internally-set spec limits , positively impacting yield.
Visibility into product performance and yield for full manufacturing site.
Maintain tight performance tolerances of RF semiconductor design. Very large datasets meant that, in some cases, it took over two days just to aggregate data and forming it to be ready for analysis.
Manufacturing and NPI data needed to be aggregated to allow limit tuning and measurement variance.
“The number one thing you are supposed to do is…look at the measurement data as it comes in. Don’t wait until it literally bangs into the limit and stops the production line. You are supposed to look for trends before you get there.”
LEONARDO needed to identify and minimize manufacturing/repair touch time as well as the ability to investigate yield and performance issues at multiple sites with Secure and Secret deployments.
They required the ability to analyze disparate data from complex test systems and normalize analysis data from ATML, NI TestStand, LabVIEW TDMS, PDF and text, CSV and Excel formats.
